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MAX9979CXG+C35
+Lista de MateriaisDUAL 1.1 GBPS PIN ELECTRONICS WI
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FabricanteAnalog Devices Inc./Maxim Integrated
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Peça do Fabricante #MAX9979CXG+C35
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Pacote 68-WFQFN Exposed Pad
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Em Estoque7911
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Especificações
| Atributo | Valor |
| Package | Tray |
| ProductStatus | Active |
| Type | DACs |
| MountingType | Surface Mount |
| Package/Case | 68-WFQFN Exposed Pad |
Visão Geral
Description
Key features of the MAX9979CXG+C35 include programmable voltage levels, fast rise and fall times, and low leakage currents, alongside compatibility with a wide range of digital protocols. Its advanced architecture ensures minimal crosstalk and signal distortion, facilitating accurate and reliable testing outcomes. The device also includes thermal management features and a robust interface for seamless integration into existing test setups.
In summary, the MAX9979CXG+C35 offers a versatile and efficient solution for semiconductor testing applications, providing enhanced performance and flexibility for test engineers and developers.
Equivalent
Features
1. High-Speed Performance: It supports data rates up to 1Gbps, making it suitable for testing fast digital devices.
2. Per-Pin Parametric Measurement Unit (PPMU): Facilitates voltage and current measurements, essential for precise device testing.
3. Flexible Drive and Compare Levels: Offers programmable voltage levels, enhancing the flexibility of testing different device technologies.
4. Wide Voltage Range: Operates over a wide voltage range, accommodating various device and test requirements.
5. Integrated Features: Includes digital-to-analog converters (DACs) and comparators, reducing the need for external components.
6. Low Power Consumption: Designed to be power-efficient, important for large-scale ATE systems.
7. Compact Package: Comes in a small form factor, ideal for space-constrained applications.
8. Enhanced Signal Integrity: Provides features to maintain high signal integrity, crucial for accurate testing.
9. Programmable Features: Offers extensive programmability to adapt to different test scenarios and requirements.
These features make the MAX9979CXG+C35 a versatile and efficient choice for modern test systems.
Pinout
The key functions of the MAX9979 include:
1. Driver: It can source and sink current to drive the DUT (Device Under Test) with specified voltage levels.
2. Comparator: It compares the DUT output with a reference voltage to determine pass or fail conditions.
3. Active Load: It provides programmable load conditions to simulate various operational environments.
This IC is used to ensure high precision and reliability in test applications, supporting rapid and accurate testing processes for semiconductor devices. For the most accurate and detailed information, refer to the manufacturer's datasheet or technical documentation.